DocumentCode
1528600
Title
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits [Book Review]
Volume
17
Issue
4
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
39
Lastpage
40
Keywords
Analog circuits; Automatic testing; Biomedical imaging; Book reviews; Built-in self-test; Circuit faults; Circuit testing; Electron tubes; Electronic equipment testing; Very large scale integration;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/MCD.2001.950085
Filename
950085
Link To Document