• DocumentCode
    1529650
  • Title

    Magnetic and magneto-optical properties and structure for (Co100-xFex)50Pt50 alloy thin films

  • Author

    Kanazawa, H. ; Ahmad, E. ; Lauhoff, G. ; Suzuki, T.

  • Author_Institution
    Toyota Technol. Inst., Nagoya, Japan
  • Volume
    37
  • Issue
    4
  • fYear
    2001
  • fDate
    7/1/2001 12:00:00 AM
  • Firstpage
    1274
  • Lastpage
    1276
  • Abstract
    The intrinsic perpendicular magnetic anisotropy constant Ku of (Co100-xFex)50Pt50 (0⩽×⩽100) alloy thin films is determined at room temperature. It is found to increase with order parameter S, and decrease with the tetragonality c/a for all compositions. The estimated Ku values obtained by the extrapolation to S=1 are nearly identical for x from 0 to 56, but increase for x beyond 56. The polar Kerr rotation is found to become more enhanced for photon energies near 1.4~3.5 eV and 4~6.8 eV with increasing x. Observations of domain structures in Fe50Pt50 thin films reveal an induced in-plane magnetic anisotropy when the thickness exceeds 1000 Å
  • Keywords
    Kerr magneto-optical effect; cobalt alloys; ferromagnetic materials; induced anisotropy (magnetic); iron alloys; magnetic domains; magnetic thin films; perpendicular magnetic anisotropy; platinum alloys; vacuum deposited coatings; (Co100-xFex)50Pt50 alloy thin films; (CoFe)50Pt50; 1.4 to 3.5 eV; 100 to 3800 angstrom; 4 to 6.8 eV; Fe50Pt50; Fe50Pt50 thin films; MgO; MgO(100) substrate; domain structures; electron beam evaporation; induced in-plane magnetic anisotropy; intrinsic perpendicular magnetic anisotropy constant; magnetic properties; magneto-optical properties; order parameter; polar Kerr rotation; room temperature; tetragonality; thickness; Iron; Magnetic analysis; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetooptic effects; Magnetooptic recording; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.950816
  • Filename
    950816