Electrooptical sampling using 1.55-μm self-seeded semiconductor laser with soliton pulse compression

Author

Reimann, O. ; Huhse, D. ; Droge, E. ; Bottcher, E.H. ; Bimberg, D. ; Stahlmann, H.D.

Author_Institution

Inst. fur Festkorperphys., Tech. Univ. Berlin, Germany

Volume

11

Issue

8

fYear

1999

Firstpage

1024

Lastpage

1026

Abstract

We report on a compact, reliable and easy to use electrooptic sampling system based on a self-seeded semiconductor laser having a temporal resolution of <1 ps and a shot noise limited sensitivity of 1 mV. With an operating wavelength of 1.55 μm and 0.5-ps time jitter of the optical source, it is particularly suited for ultrahigh-speed devices and integrated circuits. For demonstration, results for an ultrafast metal-semiconductor-metal photodetector are presented.

Keywords

electro-optical devices; laser reliability; metal-semiconductor-metal structures; optical pulse compression; optical solitons; photodetectors; semiconductor lasers; shot noise; timing jitter; voltage measurement; 0.5 ps; 1 ps; 1.55 mum; 1.55-/spl mu/m self-seeded semiconductor laser; electrooptical sampling; integrated circuits; operating wavelength; optical source; ps time jitter; reliable; shot noise limited sensitivity; soliton pulse compression; temporal resolution; ultrafast MSM photodetectors; ultrafast metal-semiconductor-metal photodetector; ultrahigh-speed devices; Integrated circuit noise; Integrated optics; Jitter; Laser noise; Lasers and electrooptics; Optical noise; Sampling methods; Semiconductor device noise; Semiconductor device reliability; Semiconductor lasers;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.775334

Filename

775334