Scatter diagram analysis of Cr segregation in Co-Cr based recording media

Author

Grogger, Werner ; Krishnan, Kannan M.

Author_Institution

Div. of Mater. Sci., Lawrence Berkeley Nat. Lab., CA, USA

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1465

Lastpage

1467

Abstract

The segregation of Cr in Co-Cr based thin film recording media was measured using energy-filtered TEM images and quantitatively evaluated by the scatter diagram (SD) method. Following a description of such SD analysis it is applied to the measurement of Cr segregation in two CoCrPtB thin film recording media with different Cr contents. Taking the entire data sets into account, the two dimensional distribution of the nonmagnetic, high Cr phase can be visualized and determined quantitatively. Cr segregates to the intergranular regions and the sample with the higher Cr content shows a significantly higher and more uniform distribution of the nonmagnetic phase at the boundaries. This leads to better magnetic isolation between the grains and correlates with the better recording performance observed in the same sample

Keywords

boron alloys; chromium alloys; cobalt alloys; ferromagnetic materials; grain boundary segregation; magnetic recording; magnetic thin films; platinum alloys; transmission electron microscopy; 2D histograms; CoCrPtB; chromium segregation; energy-filtered TEM images; intergranular regions; magnetic isolation between grains; nonmagnetic phase; recording performance; scatter diagram analysis; thin film recording media; two dimensional distribution; Chromium alloys; Electron microscopy; Energy measurement; Grain boundaries; Laboratories; Magnetic recording; Spectroscopy; Transistors; Transmission electron microscopy; X-ray scattering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.950872

Filename

950872