DocumentCode
153238
Title
High precision material characterization method using THz spectroscopy
Author
van Mechelen, J.L.M. ; Kuzmenko, A.B. ; Merbold, H.
Author_Institution
ABB Corp. Res., Baden-Dättwil, Switzerland
fYear
2014
fDate
14-19 Sept. 2014
Firstpage
1
Lastpage
1
Abstract
We propose a novel THz material analysis approach which consists of a combination of a stratified dispersive model, an appropriate measurement configuration and a time-domain based fitting procedure. The measurement configuration is modeled as a stratified system where for each layer the light-matter interaction is realistically described. The method is illustrated for the industrial quality control of (coated) paper sheets and is shown to give highly accurate results in humid air and irrespective of the position of the reference mirror in reflection.
Keywords
microwave materials; paper; quality control; spectroscopy; THz material analysis approach; THz spectroscopy; high precision material characterization method; industrial quality control; light-matter interaction; measurement configuration; paper sheets; reflection; stratified dispersive model; time-domain based fitting procedure; Analytical models; Dispersion; Fitting; Materials; Quality control; Spectroscopy; Time-domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
Conference_Location
Tucson, AZ
Type
conf
DOI
10.1109/IRMMW-THz.2014.6956335
Filename
6956335
Link To Document