• DocumentCode
    153238
  • Title

    High precision material characterization method using THz spectroscopy

  • Author

    van Mechelen, J.L.M. ; Kuzmenko, A.B. ; Merbold, H.

  • Author_Institution
    ABB Corp. Res., Baden-Dättwil, Switzerland
  • fYear
    2014
  • fDate
    14-19 Sept. 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    We propose a novel THz material analysis approach which consists of a combination of a stratified dispersive model, an appropriate measurement configuration and a time-domain based fitting procedure. The measurement configuration is modeled as a stratified system where for each layer the light-matter interaction is realistically described. The method is illustrated for the industrial quality control of (coated) paper sheets and is shown to give highly accurate results in humid air and irrespective of the position of the reference mirror in reflection.
  • Keywords
    microwave materials; paper; quality control; spectroscopy; THz material analysis approach; THz spectroscopy; high precision material characterization method; industrial quality control; light-matter interaction; measurement configuration; paper sheets; reflection; stratified dispersive model; time-domain based fitting procedure; Analytical models; Dispersion; Fitting; Materials; Quality control; Spectroscopy; Time-domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
  • Conference_Location
    Tucson, AZ
  • Type

    conf

  • DOI
    10.1109/IRMMW-THz.2014.6956335
  • Filename
    6956335