• DocumentCode
    1534906
  • Title

    Switch-level simulation and the pass transistor EXOR gate

  • Author

    Svensson, Christer ; Tjärnström, Robert

  • Author_Institution
    Dept. of Phys. & Meas. Technol., Linkoping Univ., Sweden
  • Volume
    7
  • Issue
    9
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    994
  • Lastpage
    997
  • Abstract
    The nonrestoring pass transistor EXOR gate is investigated by switch-level simulation. It is shown that the logical function of the EXOR gate depends on the driving conductance on the inputs to the gate. It is also shown why switch-level simulators are unsuccessful in simulating the pass transistor EXOR gate, and how a switch-level simulator can be designed to produce a correct simulation result
  • Keywords
    CMOS integrated circuits; circuit analysis computing; failure analysis; integrated logic circuits; logic CAD; logic gates; CMOSIC; PASOS; TMODS; driving conductance; failure analysis; logic gates; nonrestoring pass transistor; pass transistor EXOR gate; switch-level simulation; Circuit simulation; Driver circuits; Failure analysis; Helium; Inverters; Physics; SPICE; Switches;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.7797
  • Filename
    7797