DocumentCode
1536138
Title
Diagnosis of scan cells in BIST environment
Author
Rajski, Janusz ; Tyszer, Jerzy
Author_Institution
Mentor Graphics Corp., Wilsonville, OR, USA
Volume
48
Issue
7
fYear
1999
fDate
7/1/1999 12:00:00 AM
Firstpage
724
Lastpage
731
Abstract
The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution
Keywords
built-in self test; design for testability; fault diagnosis; logic testing; BIST environment; diagnostic resolution; erroneous signals; fault diagnosis technique; nonadaptive identification; pseudorandom scan cell selection routine; reasoning procedure; scan cells diagnosis; Built-in self-test; Circuit faults; Circuit testing; Compaction; Failure analysis; Fault diagnosis; Flip-flops; Hardware; Logic devices; Logic testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.780879
Filename
780879
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