Verdet constant dispersion in annealed optical fiber current sensors

Author

Rose, A.H. ; Etzel, S.M. ; Wang, C.M.

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

Volume

15

Issue

5

fYear

1997

fDate

5/1/1997 12:00:00 AM

Firstpage

803

Lastpage

807

Abstract

The Verdet constant in annealed optical fiber current sensors has been measured at wavelengths from 636 to 1320 nm. The measurements are fitted to two models, one classical and the other an expansion of the classical model that includes a nonlinear term. These measurements and models are compared to previous measurements made in optical fiber and bulk SiO₂. Our measurements have an average accuracy of ±0.6% and an average measurement uncertainty of ±0.5% over the 636 to 1320 nm range

Keywords

Faraday effect; annealing; electric current measurement; fibre optic sensors; optical fibre dispersion; optical fibre polarisation; optical fibre testing; 636 to 1320 nm; SiO₂; Verdet constant; Verdet constant dispersion; annealed optical fiber current sensors; average accuracy; average measurement uncertainty; bulk SiO₂; classical model; fiber current sensors; nonlinear term; optical fiber; Annealing; Birefringence; Magnetic field measurement; Optical fiber dispersion; Optical fiber polarization; Optical fiber sensors; Optical fiber theory; Optical fibers; Optical sensors; Wavelength measurement;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.580818

Filename

580818