• DocumentCode
    1538595
  • Title

    Systematic development of transmission-line models for interconnects with frequency-dependent losses

  • Author

    Coperich, Karen M. ; Morsey, Jason ; Okhmatovski, Vladimir I. ; Cangellaris, Andreas C. ; Ruehli, Albert E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    49
  • Issue
    10
  • fYear
    2001
  • fDate
    10/1/2001 12:00:00 AM
  • Firstpage
    1677
  • Lastpage
    1685
  • Abstract
    This paper presents a new method for the extraction of the frequency-dependent, per-unit-length (p.u.l.) resistance, and inductance parameters of multiconductor interconnects. The proposed extraction methodology is based on a new formulation of the magneto-quasi-static problem that allows lossy ground planes of finite thickness to be modeled rigorously. The formulation is such that the p.u.l. impedance matrix for the multiconductor interconnect is extracted directly at a prescribed frequency. Once the matrix has been calculated over the bandwidth of interest, rational function representations of its elements are generated through a robust matrix curve-fitting process. Such a formulation enables subsequent transient analysis of interconnects through a variety of approaches. Direct incorporation of the rational function model into a general-purpose circuit simulator and a standalone multiconductor-transmission-line simulator is demonstrated
  • Keywords
    Green´s function methods; SPICE; circuit simulation; crosstalk; equivalent circuits; finite difference time-domain analysis; integrated circuit interconnections; integrated circuit modelling; losses; method of moments; multiconductor transmission lines; skin effect; time-domain analysis; transmission line theory; frequency-dependent losses; general-purpose circuit simulator; inductance parameters; lossy ground planes; magneto-quasi-static problem; matrix curve-fitting process; multiconductor interconnects; per-unit-length resistance; rational function representations; standalone multiconductor-transmission-line simulator; transient analysis; transmission-line models; Bandwidth; Circuit simulation; Curve fitting; Frequency; Impedance; Inductance; Integrated circuit interconnections; Robustness; Transmission line matrix methods; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.954771
  • Filename
    954771