Experimental demonstration of a balanced electroabsorption modulated microwave photonic link

Author

Mathai, Sagi ; Cappelluti, Federica ; Jung, Thomas ; Novak, Dalma ; Waterhouse, Rodney B. ; Sivco, Deborah ; Cho, Alfred Y. ; Ghione, Giovanni ; Wu, Ming C.

Author_Institution

Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA

Volume

49

Issue

10

fYear

2001

fDate

10/1/2001 12:00:00 AM

Firstpage

1956

Lastpage

1961

Abstract

A novel balanced electroabsorption modulated photonic link for simultaneous suppression of even-order distortions, third-order distortions, laser relative intensity noise (RIN), and common amplified spontaneous emission noise at the same modulator bias point was experimentally demonstrated for the first time. By biasing the balanced electroabsorption modulator at the third-order null, the third-order distortions were suppressed, while the balanced link architecture suppressed all even-order distortions and common mode noises. The fabricated balanced electroabsorption modulator (B-EAM) showed well-matched dc characteristics in terms of I-V and transfer curve. System experiments were performed to compare single-EAM and B-EAM links. In the B-EAM link, 2-dB suppression of laser RIN and 20-dB improvement in spurious free dynamic range over the single-EAM link were observed

Keywords

electro-optical modulation; intermodulation distortion; microwave photonics; optical fibre communication; optical noise; B-EAM; balanced electroabsorption modulated link; common amplified spontaneous emission noise; even-order distortions; laser relative intensity noise; microwave photonic link; modulator bias point; spurious free dynamic range; third-order distortions; well-matched dc characteristics; Distributed feedback devices; Intensity modulation; Laser modes; Laser noise; Masers; Noise measurement; Optical distortion; Optical modulation; Semiconductor device noise; Spontaneous emission;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.954814

Filename

954814