• DocumentCode
    1538869
  • Title

    A fault-tolerant GaAs/CMOS interconnection network for scalable multiprocessors

  • Author

    Butner, steven E. ; Bordelon, Scott L. ; Endres, Lisa ; Dodd, James ; Shetler, Joy

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • Volume
    26
  • Issue
    5
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    692
  • Lastpage
    705
  • Abstract
    The design of an interconnection network (ICN) for a scalable multiprocessor system is presented. The tree-structured network (called SHUNT for scalable hierarchical unidirectional network topology) is organized so that it can be scaled not only in width (through the use of bit slicing), but also in number of ports and in data transfer speed. The network is made from three custom chip types: cluster controller, crossbar switch, and network interface. Implementation of the first prototype chips in 2-μm CMOS is discussed, and the results of detailed circuit simulations for GaAs implementations are given. The network is fault tolerant and is able to detect and correct all single-bit transmission errors. In addition, it can detect failures and reconfigure to work around problems in controllers, port interfaces, or user processors. The network is part of the experimental decoupled computer architect project (DART) currently under study and development
  • Keywords
    CMOS integrated circuits; III-V semiconductors; application specific integrated circuits; digital integrated circuits; error correction; error detection; fault tolerant computing; gallium arsenide; multiprocessor interconnection networks; 2 micron; ASIC; CMOS interconnection network; DART; GaAs; SHUNT; bit slicing; cluster controller; crossbar switch; custom chip; decoupled computer architect project; fault-tolerant; monolithic IC; network interface; scalable hierarchical unidirectional network topology; scalable multiprocessor system; single-bit transmission errors; tree-structured network; Circuit simulation; Electrical fault detection; Fault tolerance; Gallium arsenide; Multiprocessing systems; Multiprocessor interconnection networks; Network interfaces; Network topology; Switches; Virtual prototyping;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.78240
  • Filename
    78240