DocumentCode
153998
Title
Adaptive sized Quasi-Monte Carlo based yield aware analog circuit optimization tool
Author
Afacan, Engin ; Berkol, Gonenc ; Pusane, Ali E. ; Dundar, Gunhan ; Baskaya, Faik
Author_Institution
Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
fYear
2014
fDate
Sept. 29 2014-Oct. 1 2014
Firstpage
1
Lastpage
6
Abstract
This paper proposes an efficient Quasi-Monte Carlo based yield aware analog circuit synthesis tool with an adaptive sampling mechanism. Monte Carlo (MC) analysis is commonly preferred to estimate process variation effects on the yield of manufactured ICs. However, conventional MC requires a large number of simulations for accurate estimation. This situation causes excessive synthesis times during yield aware optimization, where many iterative variability simulations are performed. To enhance the efficiency, Infeasible Solution Elimination approach is utilized, in which yield estimation is not performed for infeasible solutions. In addition to this approach, a more efficient MC method, called Quasi-Monte Carlo (QMC), is used to generate samples from the uncertain parameter space. Thanks to the homogeneous distribution of samples, the required number of simulations is substantially reduced. Furthermore, QMC allows iterative generation of samples; hence enabling the sample size to be increased without restarting the entire simulation from the beginning. Using this property of QMC, an adaptive mechanism is proposed to determine the minimum sample size required for accurate yield estimation. The yield term is introduced as a new design constraint to the optimizer together with the electrical constraints. Finally, the developed tool offers an additional part, where a simulation budget allocation algorithm promises a more accurate yield estimation for the valuable candidates.
Keywords
Monte Carlo methods; analogue circuits; iterative methods; optimisation; Monte Carlo analysis; adaptive sampling mechanism; budget allocation algorithm; iterative generation; iterative variability simulations; process variation effects; quasi Monte Carlo based yield aware analog circuit optimization tool; uncertain parameter space; Adaptation models; Analog circuits; Integrated circuit modeling; Optimization; Sociology; Statistics; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
CMOS Variability (VARI), 2014 5th European Workshop on
Conference_Location
Palma de Mallorca
Type
conf
DOI
10.1109/VARI.2014.6957080
Filename
6957080
Link To Document