High-resistivity SNS Josephson junctions scribed in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// by electron irradiation

Author

Davidson, B.A. ; Hinaus, B. ; Rzchowski, M. ; Siangchaew, K. ; Libera, M. ; Nordman, J.E.

Author_Institution

Wisconsin Univ., Madison, WI, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

2518

Lastpage

2521

Abstract

We demonstrate that the behavior of Josephson junctions scribed in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) with a high-brightness electron source are described well by conventional superconductor-normal-superconductor (SNS) theory. These junction characteristics include a fully normal interlayer (T/sub cN/=0), intermediate length (L//spl xi//sub n/(T/sub c/)/spl ap/8-10), and a reduced order parameter at the SN interface. Consistent application of this model of diffusive transport across a metallic interlayer in the dirty limit requires a reduced carrier concentration in the irradiated region, a junction length L/spl ap/5 nm, and a normal resistivity near the metallic limit. I/sub c/R/sub n/ products higher than 3 mV at low temperatures are observed.

Keywords

Josephson effect; barium compounds; carrier density; critical currents; electron beam lithography; high-temperature superconductors; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 7/; carrier concentration; diffusive transport; dirty limit; electron irradiation; high-brightness electron source; high-resistivity SNS Josephson junctions; junction length; normal interlayer; normal resistivity; order parameter; Boundary conditions; Critical current; Current measurement; Electrodes; Electrons; Josephson junctions; Magnetic field measurement; RNA; Temperature distribution; Temperature measurement;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.621751

Filename

621751