• DocumentCode
    1541513
  • Title

    High- Q Tunable Microwave Cavity Resonators and Filters Using SOI-Based RF MEMS Tuners

  • Author

    Liu, Xiaoguang ; Katehi, Linda P B ; Chappell, William J. ; Peroulis, Dimitrios

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    19
  • Issue
    4
  • fYear
    2010
  • Firstpage
    774
  • Lastpage
    784
  • Abstract
    This paper presents the modeling, design, fabrication, and measurement of microelectromechanical systems-enabled continuously tunable evanescent-mode electromagnetic cavity resonators and filters with very high unloaded quality factors (Qu). Integrated electrostatically actuated thin diaphragms are used, for the first time, for tuning the frequency of the resonators/filters. An example tunable resonator with 2.6:1 (5.0-1.9 GHz) tuning ratio and Qu of 300-650 is presented. A continuously tunable two-pole filter from 3.04 to 4.71 GHz with 0.7% bandwidth and insertion loss of 3.55-2.38 dB is also shown as a technology demonstrator. Mechanical stability measurements show that the tunable resonators/filters exhibit very low frequency drift (less than 0.5% for 3 h) under constant bias voltage. This paper significantly expands upon previously reported tunable resonators.
  • Keywords
    Q-factor; cavity resonator filters; mechanical stability; micromechanical devices; microwave filters; silicon-on-insulator; SOI-based RF MEMS tuners; frequency 5 GHz to 1.9 GHz; high-Q tunable microwave cavity resonators; integrated electrostatically actuated thin diaphragms; loss 3.55 dB to 2.38 dB; mechanical stability measurements; microelectromechanical systems; microwave filters; quality factors; time 3 hr; tunable evanescent-mode electromagnetic cavity resonators; Electrostatic actuation; evanescent-mode cavity; microelectromechanical systems (MEMS); quality factor; tunable filter; tunable resonator; tuning;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2010.2055544
  • Filename
    5512545