• DocumentCode
    1541692
  • Title

    Fields at a Finite Conducting Wedge and Applications in Interconnect Modeling

  • Author

    Demeester, Thomas ; De Zutter, Daniël

  • Author_Institution
    Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
  • Volume
    58
  • Issue
    8
  • fYear
    2010
  • Firstpage
    2158
  • Lastpage
    2165
  • Abstract
    The fields at a finite conducting 2-D wedge are studied by means of the surface admittance operator, and compared to the case of a perfect conductor. This technique, applied to a number of numerical examples, allows a thorough investigation of the singular behavior of the fields near the edge, including nonsingular fields such as the longitudinal current distribution. Special attention is devoted to the validity of the quasi-TM approximations, when edge singularities are taken into account. The studied field properties lead to the formulation of an approximative local surface impedance for conductors, and are finally used to show how some differences in the resistive and inductive behavior of conductors with a different geometry are due to edge effects.
  • Keywords
    conductors (electric); current distribution; integrated circuit interconnections; approximative local surface impedance; edge effects; edge singularities; finite conducting 2D wedge; interconnect modeling; longitudinal current distribution; quasi-TM approximations; surface admittance operator; Conductivity; Conductors; Dielectric losses; Frequency; Inductance; Integrated circuit interconnections; Skin effect; Surface impedance; Surface resistance; Very large scale integration; Conductor; edge effect; finite conductivity; inductance; resistance; skin effect; surface impedance; transmission line parameters; wedge;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2010.2053061
  • Filename
    5512577