DocumentCode
1541692
Title
Fields at a Finite Conducting Wedge and Applications in Interconnect Modeling
Author
Demeester, Thomas ; De Zutter, Daniël
Author_Institution
Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
Volume
58
Issue
8
fYear
2010
Firstpage
2158
Lastpage
2165
Abstract
The fields at a finite conducting 2-D wedge are studied by means of the surface admittance operator, and compared to the case of a perfect conductor. This technique, applied to a number of numerical examples, allows a thorough investigation of the singular behavior of the fields near the edge, including nonsingular fields such as the longitudinal current distribution. Special attention is devoted to the validity of the quasi-TM approximations, when edge singularities are taken into account. The studied field properties lead to the formulation of an approximative local surface impedance for conductors, and are finally used to show how some differences in the resistive and inductive behavior of conductors with a different geometry are due to edge effects.
Keywords
conductors (electric); current distribution; integrated circuit interconnections; approximative local surface impedance; edge effects; edge singularities; finite conducting 2D wedge; interconnect modeling; longitudinal current distribution; quasi-TM approximations; surface admittance operator; Conductivity; Conductors; Dielectric losses; Frequency; Inductance; Integrated circuit interconnections; Skin effect; Surface impedance; Surface resistance; Very large scale integration; Conductor; edge effect; finite conductivity; inductance; resistance; skin effect; surface impedance; transmission line parameters; wedge;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2010.2053061
Filename
5512577
Link To Document