A low power 12 bit flux shuttle shift register with Nb technology

Author

Lochschmied, R. ; Herwig, R. ; Neuhaus, M. ; Jutzi, W.

Author_Institution

Inst. fur Electrotech. Grundlagen der Inf., Karlsruhe Univ., Germany

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

2983

Lastpage

2986

Abstract

A 12 bit Flux Shuttle shift register with a new write and readout gate has been simulated and fabricated using Nb/Al/sub 2/O/sub 3//Nb Josephson junctions. Write, shift and read operations have been tested successfully at 4.2 K. Drive currents are independent from input bit sequence. Although measurements were disturbed by trapped flux, minimum margins are /spl Delta/I=/spl plusmn/10%. The power dissipation of a shift register cell is 9 nW/GHz. Total power losses caused by terminating resistors are 70 /spl mu/W. The minimum line width may be scaled down to 0.5 /spl mu/m, because power losses per unit area of long Flux Shuttle shift registers are extremely low.

Keywords

Josephson effect; alumina; niobium; shift registers; superconducting logic circuits; 0.5 micron; 12 bit; 4.2 K; 70 muW; Nb technology; Nb-Al/sub 2/O/sub 3/-Nb; Nb/Al/sub 2/O/sub 3//Nb Josephson junction; flux shuttle shift register; line width; low power circuit; power dissipation; power loss; readout gate; write gate; Circuits; Clocks; Josephson junctions; Niobium; Power dissipation; Resistors; Shift registers; Switches; Testing; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.621945

Filename

621945