• DocumentCode
    1543638
  • Title

    On the Equivalence of Finite Element and Finite Integration Formulations

  • Author

    Demenko, A. ; Sykulski, J.K. ; Wojciechowski, R.

  • Author_Institution
    Poznan Univ. of Technol., Poznan, Poland
  • Volume
    46
  • Issue
    8
  • fYear
    2010
  • Firstpage
    3169
  • Lastpage
    3172
  • Abstract
    The paper offers a comparative study of numerical methods of analysis of electromagnetic fields. The focus is on the finite element method (FEM) and finite integration technique (FIT), but with the cell and equivalent network approaches also considered. It is shown how the approximate integrals describing coefficients of the FEM need to be derived for a mesh with parallelepiped elements to achieve consistency with FIT equations. The equivalence of FEM and FIT formulations for a triangular mesh in 2D is highlighted. The TEAM Workshops Problem No. 7 is used as an example for numerical comparisons. Two formulations have been considered: 1) using the edge values of the magnetic vector potential A and the nodal values of the electric scalar potential V; and 2) expressed in terms of the edge values of both magnetic A and electric T-T0 vector potentials.
  • Keywords
    eddy currents; electromagnetic field theory; integration; mesh generation; TEAM workshop problem; approximate integrals; edge values; electric scalar potential; electromagnetic fields; equivalent network approaches; finite element method; finite integration technique; magnetic vector potential; nodal values; numerical methods; parallelepiped elements; triangular mesh; Computer science; Electric potential; Electrical engineering education; Electromagnetic analysis; Electromagnetic fields; Finite element methods; Helium; Integral equations; Interpolation; Magnetic circuits; Eddy currents; electrical engineering education; finite element method (FEM); finite integration technique (FIT); magnetic circuits;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2043506
  • Filename
    5513001