Counting SFQ analog to digital converter results

We have characterized Nb analog to digital converters using a resistor-coupled SFQ flip flop counter and a latching destructive readout (DRO). The counter used SFQ buffers between bits to provide isolation during destructive readout. We have measured parallel readout at sample rates up to 125 MSPS. We have also successfully operated an ADC which has Josephson junction regulated flip flop gate and readout bias busses. Using a self-resetting gate (SRG) at the carry out of the counter, we have measured the bit error rates (BER) of the counters. A two junction SQUID quantizer, biased in the voltage state, was used to produce correlated SFQ pulses at each junction. The SRG outputs of two 10 bit counters connected to the two quantizer outputs were compared. We measured a BER of /spl sim/5/spl times/10/sup -11/ with the quantizer operating at 19 GHz. We believe the principle error source is the latching SRG.