DocumentCode
1544261
Title
Passivation, transition width, and noise for YBCO bolometers on silicon
Author
McDonald, D.G. ; Phelan, R.J., Jr. ; Vale, L.R. ; Ono, R.H. ; Rudman, D.A.
Author_Institution
Boulder Metric Inc., CO, USA
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
4471
Lastpage
4474
Abstract
We are developing YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) thermometers for large area bolometers that include a heater for calibration by the electrical substitution of power. Because YBCO on buffered Si is under mechanical stress and must be very thin to avoid cracking, we find it is electrically sensitive to its passivation layer. For example, passivation by SrTiO/sub 3/ raised the noise in our films by about a factor of 100. An alternative is to first cap the YBCO with Au for passivation, and then add an insulator for electrical isolation. Such devices have a narrower transition width, by a factor of 3.9. A model with a shunt resistor across the superconductor predicts a narrowing of the transition, but by less than the observed amount. The noise equivalent temperatures of our thermometers, about 4 nK Hz/sup -1/2/, are not degraded by the normal metal shunt, although the resistance is decreased. The resistance is decreased. The resistance can be raised using AgAu alloy in place of Au, with equivalent noise performance.
Keywords
barium compounds; bolometers; high-temperature superconductors; passivation; resistance thermometers; superconducting device noise; yttrium compounds; AgAu; Au; Si; SrTiO/sub 3/; YBCO bolometer; YBa/sub 2/Cu/sub 3/O/sub 7/; buffered silicon substrate; electrical calibration; high temperature superconductor; noise equivalent temperature; passivation; shunt resistor; thermometer; transition width; Bolometers; Calibration; Dielectrics and electrical insulation; Gold; Passivation; Predictive models; Stress; Superconducting device noise; Superconducting films; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.784018
Filename
784018
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