• DocumentCode
    1544386
  • Title

    Estimation of lightning shielding failures and mid-span back-flashovers based on the performance of EHV double circuit transmission lines

  • Author

    Udo, T.

  • Volume
    12
  • Issue
    2
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    832
  • Lastpage
    836
  • Abstract
    In Japan, many unbalanced installation double-circuit EHV transmission lines were constructed to prevent simultaneous lightning faults on both the circuits. A one-line fault on the higher insulated circuit is either a shielding failure or a mid-span back-flashover. To discriminate shielding failures and mid-span back-flashovers among all the faults, the author analyzed the lightning performance of these unbalanced insulation lines. Both the unbalanced insulation lines and the balanced insulation lines are similar in the probability of causing a shielding failure and a midspan back-flashover, since both are the same in the configuration of shielding wires and phase conductors independent of the insulation mode. As a result of analysis, the author estimated that about 25~40% of all the lightning faults on the double-circuit balanced insulation lines are shielding failures, and that few mid-span back-flashovers happen there
  • Keywords
    flashover; insulation; lightning protection; power overhead lines; power transmission lines; shielding; EHV double circuit transmission lines; Japan; balanced insulation lines; double-circuit balanced insulation lines; lightning performance; lightning shielding failures estimation; mid-span back-flashover; mid-span back-flashovers; midspan back-flashover; one-line fault; phase conductors; shielding failures; shielding wires; simultaneous lightning faults prevention; unbalanced insulation lines; Cable insulation; Circuit faults; Distributed parameter circuits; Failure analysis; Flashover; Life estimation; Lightning; Poles and towers; Probability; Wire;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.584393
  • Filename
    584393