• DocumentCode
    1544506
  • Title

    The future of bipolar power transistors

  • Author

    Huang, Alex Q. ; Zhang, Bo

  • Author_Institution
    Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    48
  • Issue
    11
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    2535
  • Lastpage
    2543
  • Abstract
    Silicon based bipolar power transistor (BPT) as a switching power transistor has been replaced by other superior power devices in the past two decades. This transformation is primarily due to the poor performance of the BPT. Among many problems of the BPT, low current gain and small safe operation area (SOA) caused by the second breakdown have been most detrimental to silicon BPT´s fate. However, BPT performance based on newer materials, such as wide bandgap semiconductors, has not been previously studied. This paper systematically compares the BPTs based on wide bandgap semiconductor materials. Device figures-of-merit for conduction and switching losses are proposed. Comparison of the BPT based on total power loss is then provided. Based on this work, it is concluded that BPTs based on wide bandgap materials overcome the critical disadvantages of silicon BPTs, and are capable of switching power operation at several hundred kilohertz frequencies at very high current densities and voltages. Therefore, BPTs based on wide bandgap materials are still very attractive switching power devices for the future
  • Keywords
    power bipolar transistors; power semiconductor switches; wide band gap semiconductors; bipolar power transistor; conduction loss; current gain; figure of merit; power loss; safe operation area; second breakdown; switching loss; switching power device; wide bandgap semiconductor; Conducting materials; Electric breakdown; Photonic band gap; Power semiconductor switches; Power transistors; Semiconductor materials; Semiconductor optical amplifiers; Silicon; Switching loss; Wide band gap semiconductors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.960379
  • Filename
    960379