Advanced on-chip test technology for RSFQ circuits

We have developed an advanced version of on-chip test system with new high-speed clock generation and control. For high-speed clock generation, a novel wide-bandwidth ring generator is designed using circular Josephson transmission lines with an inductively coupled trigger. The generator is capable of producing SFQ clock pulses in the range of from 15 to 55 GHz using a 1 kA/cm/sup 2/ Nb fabrication process. For clock control, we have designed two different types of clock-controller circuits based on programmable shift-register and counter. Using the on-chip test system, we have successfully tested a parallel multiplier module up to 15 GHz with 16% dc bias margins.