• DocumentCode
    1546045
  • Title

    Adaptive Alternate Analog Test

  • Author

    Stratigopoulos, Haralampos-G ; Mir, Salvador

  • Author_Institution
    TIMA Lab., Grenoble INP-UJF, Grenoble, France
  • Volume
    29
  • Issue
    4
  • fYear
    2012
  • Firstpage
    71
  • Lastpage
    79
  • Abstract
    Adaptive test is a promising approach for test cost reduction. This article presents an adaptive test scheme for analog circuits that capitalizes on alternate test to achieve a low cost for the majority of fabricated devices. The small fraction of devices for which the alternate test decision may be prone to error are identified and further action is taken.
  • Keywords
    analogue circuits; circuit testing; adaptive alternate analog test; analog circuit; test cost reduction; Adaptive systems; Correlation; Density measurement; Radio frequency; Standards; Testing; Training; Analog test; adaptive test; alternate test; defect filter; nonparametric statistics;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2012.2205480
  • Filename
    6222115
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1546045