• DocumentCode
    1546265
  • Title

    Floating body induced pre-kink excess low-frequency noise in submicron SOI CMOSFET technology

  • Author

    Tseng, Ying-Che ; Huang, W. Margaret ; Ilderem, Vida ; Woo, Jason C S

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    20
  • Issue
    9
  • fYear
    1999
  • Firstpage
    484
  • Lastpage
    486
  • Abstract
    The well-known post-kink Lorentzian-like noise overshoot has been empirically correlated to the ac kink effect in the SOI CMOSFET in the past. This work demonstrates the existence of a 1/f/sup 2/ excess noise spectrum (<100 Hz) superimposed upon 1/f noise in partially depleted (PD) floating body SOI CMOS when devices are biased in the pre-kink region (before the dc kink onset voltage). While the impact ionization phenomenon is negligible in the pre-kink region, the new observed pre-kink excess noise provides a new insight into the body voltage instability and current fluctuation in the SOI CMOSFET.
  • Keywords
    1/f noise; MOSFET; semiconductor device noise; silicon-on-insulator; 1/f noise; 1/f/sup 2/ noise; current fluctuation; partially depleted floating body SOI CMOSFET; pre-kink excess low-frequency noise; submicron technology; voltage instability; CMOS digital integrated circuits; CMOS process; CMOS technology; CMOSFETs; Fluctuations; Frequency; Impact ionization; Low-frequency noise; Semiconductor device noise; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.784460
  • Filename
    784460