Modeling in the presence of switching uncertainties

Author

Van Moer, Wendy ; Rolain, Yves ; Pintelon, Rik

Author_Institution

Dept. ELEC/TW, Vrije Univ., Brussels, Belgium

Volume

50

Issue

5

fYear

2001

fDate

10/1/2001 12:00:00 AM

Firstpage

1103

Lastpage

1108

Abstract

This paper presents a method that takes into account the switching uncertainties in the signal path of the measurement devices during the identification of device models. Switching phenomena in the measurement instrument, like switching attenuators, induce jumps in the measured input-output characteristic that can be much larger than the noise contributions. The proposed method eliminates the subsequent model error by considering these jumps as a signal path state dependent stochastic contribution

Keywords

Bayes methods; electron device noise; maximum likelihood estimation; measurement theory; measurement uncertainty; network analysers; nonlinear systems; stochastic processes; switching transients; Bayes estimation; device models; identification; input-output characteristic; model error; nonlinear measurement; signal path; switching attenuators; switching uncertainties; Additive noise; Attenuation measurement; Attenuators; Frequency estimation; Maximum likelihood estimation; Noise measurement; Performance evaluation; Power system modeling; Stochastic resonance; Uncertainty;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.963167

Filename

963167