Transport properties of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// bicrystals with [100] tilt grain boundaries

Author

Tsay, Y.N. ; Li, Q. ; Zhu, Y. ; Suenaga, M. ; Shibutani, K. ; Shigaki, I. ; Ogawa, R.

Author_Institution

Dept. of Appl. Sci., Brookhaven Nat. Lab., Upton, NY, USA

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

1622

Lastpage

1625

Abstract

We have successfully isolated more than a dozen of naturally-grown [100] tilt Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// (Bi-2212) bicrystals for the study of the transport properties of the grain boundary. These bicrystals contain a single clean [100] non-basal-plane-faced tilt grain boundary with various degrees of misorientation. Systematic transport measurements of these grain boundaries were performed in a wide range of temperature and magnetic field by measuring the resistance and the current-voltage characteristics for both single crystals and grain boundaries simultaneously. In addition, the microstructures of the grain boundaries in some of these bicrystals were studied by both conventional TEM and high-resolution electron microscopy (HREM).

Keywords

bicrystals; bismuth compounds; calcium compounds; crystal microstructure; electric resistance; electron microscopy; grain boundaries; high-temperature superconductors; strontium compounds; tilt boundaries; transmission electron microscopy; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// bicrystals; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/; HREM; TEM; [100] tilt grain boundaries; current-voltage characteristics; high temperature superconductors; high-resolution electron microscopy; microstructures; misorientation; resistance; single crystals; transmission electron microscopy; transport properties; Bismuth; Crystal microstructure; Current measurement; Current-voltage characteristics; Electrical resistance measurement; Grain boundaries; Magnetic field measurement; Performance evaluation; Strontium; Temperature distribution;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.784708

Filename

784708