Influence of growth temperature and composition on structural disorder in YBCO thin films

Author

Gibson, G. ; Humphreys, R.G. ; Cohen, L.F. ; MacManus-Driscoll, J.L.

Author_Institution

Dept. of Mater., Imperial Coll. of Sci., Technol. & Med., London, UK

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

1848

Lastpage

1851

Abstract

Structural disorder has been measured using Raman spectroscopy for a series of films, which were grown by e-beam co-evaporation. The growth temperature and the cation stoichiometry of YBCO are essential parameters controlling the formation of structural disorder. Higher growth temperatures and higher Y fluxes produced more perfectly ordered films. Less spatial variation occurs in films with lower amounts of structural disorder.

Keywords

Raman spectra; barium compounds; crystal structure; high-temperature superconductors; stoichiometry; superconducting thin films; yttrium compounds; Raman spectroscopy; YBCO thin films; YBa/sub 2/Cu/sub 3/O/sub 7/; cation stoichiometry; composition; e-beam co-evaporation; growth temperature; high temperature superconductor; structural disorder; Educational institutions; Electrical resistance measurement; Spectroscopy; Strain measurement; Substrates; Superconducting thin films; Surface resistance; Temperature; Transistors; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.784817

Filename

784817