Experiences with concurrent fault simulation of diagnostic programs

Author

Demba, Stephen ; Ulrich, Ernst ; Lentz, Karen Panetta ; Giramma, David

Author_Institution

Digital Equipment Corp., Hudson, MA, USA

Volume

9

Issue

6

fYear

1990

fDate

6/1/1990 12:00:00 AM

Firstpage

621

Lastpage

628

Abstract

A methodology is presented for fault simulation of a system level diagnostic program involving large models (50000 to 200000 gates) and long test sequences. The accuracy of memory models and the interplay of fault insertion and fault selection with diagnostic program development are topics covered. It also details observation and statistical methods and tools used to investigate the operation of `faulty machines´ (the fault effects created by an individual fault source). Observation of individual faulty machines is critical to provide information about looping and erratic programs, violations to subprogram sequencing, etc. This methodology is a successful attempt to make fault simulation of system diagnostics feasible

Keywords

fault location; fault tolerant computing; program diagnostics; concurrent fault simulation; diagnostic programs; fault insertion; fault selection; memory models; statistical methods; Computational modeling; Counting circuits; Fault detection; Helium; Logic; Power engineering and energy; Semiconductor device measurement; Statistical analysis; Statistics; System testing;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.55192

Filename

55192