• DocumentCode
    1548147
  • Title

    Error-rate patterns for the modeling of optically amplified transmission systems

  • Author

    Ribeiro, M.R.N. ; Waldman, H. ; Klein, J. ; de Souza Mendes, L.S.

  • Volume
    15
  • Issue
    4
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    707
  • Lastpage
    716
  • Abstract
    High-speed, photonically amplified digital links have their performance limited by a complex combination of intersymbol interference, laser nonlinearities, and signal-dependent noise. Determination of the worst case patterns cannot rely on the classical eye diagram anymore, but requires more sophisticated computational metrics, which are discussed. A new approach to performance evaluation of these systems is based on error-rate patterns that have been proposed before as a generalization of the classical eye-diagram concept in an experimental environment. We discuss the extension of this approach to the computer-aided modeling, analysis, and design (CAMAD) of these communication links.
  • Keywords
    CAD; computer aided analysis; digital communication; digital simulation; error statistics; fibre lasers; intersymbol interference; optical fibre communication; software tools; telecommunication computing; EDFA; communication links; computational metrics; computer-aided analysis; computer-aided design; computer-aided modeling; erbium doped fibre amplifier; error rate patterns; experimental environment; generalised eye diagram concept; intersymbol interference; laser nonlinearities; optically amplified transmission systems; performance evaluation; photonically amplified digital links; signal dependent noise; simulation tool; system performance; worst case patterns; Computer errors; Fiber nonlinear optics; Gaussian noise; High speed optical techniques; Nonlinear optics; Optical distortion; Optical noise; Optical transmitters; Signal analysis; Stimulated emission;
  • fLanguage
    English
  • Journal_Title
    Selected Areas in Communications, IEEE Journal on
  • Publisher
    ieee
  • ISSN
    0733-8716
  • Type

    jour

  • DOI
    10.1109/49.585781
  • Filename
    585781