DocumentCode
1548160
Title
Comparative studies of irreversibility lines and critical current in heavy ion irradiated Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// bicrystals with [001] twist grain boundaries
Author
Qiang Li ; Tsay, Y.N. ; Suenaga, M. ; Wirth, G. ; Gu, G.D. ; Koshizuka, N.
Author_Institution
Dept. of Appl. Sci., Brookhaven Nat. Lab., Upton, NY, USA
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
2026
Lastpage
2029
Abstract
Columnar defects, through 2.2 GeV Au-ions irradiation, were introduced into Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// (Bi-2212) bicrystals with [001] twist grain boundaries. Studies of the effect of heavy ion irradiation on the transport properties of the bicrystals were performed by measuring the irreversibility line and critical current within the constituent single crystals and across the [001] twist grain boundaries before and after irradiation. We found that the columnar defects greatly increased the irreversible temperature determined both within the single crystals and across the grain boundaries. However, the enhancement on critical current by the columnar defects measured across the grain boundaries is not significant, while more than an order of magnitude increase in the single crystal critical current was observed.
Keywords
bicrystals; bismuth compounds; calcium compounds; ceramics; critical current density (superconductivity); high-temperature superconductors; ion beam effects; melt texturing; strontium compounds; twist boundaries; 2.2 GeV; Au; Au-ions irradiation; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/; [001] twist grain boundaries; columnar defects; critical current; heavy ion irradiated Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// bicrystals; irreversibility lines; twist grain boundaries; Bismuth; Critical current; Current measurement; Grain boundaries; High temperature superconductors; Laboratories; Large-scale systems; Performance evaluation; Superconducting films; Superconductivity;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.784862
Filename
784862
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