• DocumentCode
    1548675
  • Title

    Pulsed laser deposition of YBCO and NBCO using experimental design

  • Author

    Eulenburg, A. ; Romans, E.J. ; Pegrum, C.M.

  • Author_Institution
    Dept. of Phys. & Appl. Phys., Strathclyde Univ., Glasgow, UK
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    2402
  • Lastpage
    2405
  • Abstract
    Thin films of YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) and NdBa/sub 2/Cu/sub 3/O/sub 7-x/ (NBCO) were grown by pulsed laser deposition (PLD). The experiment was planned using experimental design to investigate the relative importance of the individual growth parameters for the properties of the films. For both materials critical temperatures close to 90 K were obtained. The electrical and morphological properties of the films were correlated to the growth conditions using regression analysis. For NBCO, regions where both electrical and morphological properties were optimised could be found, while for YBCO we found that the main factors that lead to high critical temperatures also lead to a substantial increase in the surface roughness.
  • Keywords
    barium compounds; design of experiments; high-temperature superconductors; neodymium compounds; pulsed laser deposition; statistical analysis; superconducting thin films; superconducting transition temperature; surface topography; yttrium compounds; 90 K; NdBa/sub 2/Cu/sub 3/O/sub 7-x/; NdBa/sub 2/Cu/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3/O/sub 7-x/; YBa/sub 2/Cu/sub 3/O/sub 7/; critical temperature; electrical properties; experimental design; film properties; growth parameters; morphological properties; pulsed laser deposition; regression analysis; surface roughness; Design for experiments; Optical materials; Optical pulses; Pulsed laser deposition; Regression analysis; Rough surfaces; Sputtering; Surface roughness; Temperature; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.784956
  • Filename
    784956