• DocumentCode
    1549445
  • Title

    Subthreshold CMOS voltage reference circuit with body bias compensation for process variation

  • Author

    Luo, Haipeng ; Han, Yi ; Cheung, Ray C. C. ; Liang, Guozheng ; Zhu, Dalong

  • Author_Institution
    Dept. of ISEE, Zhejiang Univ., Hangzhou, China
  • Volume
    6
  • Issue
    3
  • fYear
    2012
  • fDate
    5/1/2012 12:00:00 AM
  • Firstpage
    198
  • Lastpage
    203
  • Abstract
    This study presents a subthreshold complementary metal oxide semiconductor (CMOS) voltage reference circuit that adopts dynamical body bias to compensate the process-related reference voltage fluctuation. The proposed circuit generates a mean reference voltage of 0.781 V at 1.2 V supply and 27°C, reduces the standard deviation (σ) of the reference voltage from 11 mV to only 3 mV, and meanwhile improves the power supply rejection ratio from -30.7 to -51.4 dB. The average temperature coefficient measured from 0 to 100°C is 48 ppm/°C, and the line regulation is 0.34%/V in a supply voltage ranging from 1.2 to 2.3 V. The maximum supply current is 8.1 μA at 1.2 V supply and 100°C, and the chip area is 0.0533 mm2 in 0.13-μm CMOS technology.
  • Keywords
    CMOS integrated circuits; reference circuits; body bias compensation; complementary metal oxide semiconductor circuit; current 8.1 muA; dynamical body bias; line regulation; power supply rejection ratio; process variation; process-related reference voltage fluctuation compensation; size 0.13 mum; subthreshold CMOS voltage reference circuit; temperature 0 degC to 100 degC; voltage 0.781 V; voltage 1.2 V to 2.3 V;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices & Systems, IET
  • Publisher
    iet
  • ISSN
    1751-858X
  • Type

    jour

  • DOI
    10.1049/iet-cds.2011.0170
  • Filename
    6226935