DocumentCode
1549493
Title
Perturbation analysis and modeling of curved microstrip bends
Author
Weisshaar, Andreas ; Tripathi, Vijai K.
Author_Institution
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume
38
Issue
10
fYear
1990
fDate
10/1/1990 12:00:00 AM
Firstpage
1449
Lastpage
1454
Abstract
The curved microstrip bend consisting of a microstrip ring segment between two microstrip lines is analyzed for its transmission properties. The microstrip lines are modeled by equivalent ideal magnetic wall waveguides for which the electromagnetic field solutions are known. The field solutions in the microstrip ring segment are derived by using a perturbation analysis of a modified (magnetic wall) curved waveguide model. Other techniques have been formulated to evaluate the fields inside curved metallic waveguides. These include the use of an equivalent nonuniformly loaded straight waveguide and rectangular and annular model analysis. The perturbation solution for the fields in the equivalent curved waveguide model presented is readily adaptable to the mode-matching procedure, and is used to calculate the properties of the curved microstrip bend discontinuities. The frequency-dependent reflection and transmission coefficients of curved microstrip bends are determined and compared with those of the right-angle and chamfered right-angle microstrip bends
Keywords
S-parameters; perturbation techniques; strip lines; waveguide theory; convergence behavior; curved microstrip bends; discontinuities; electromagnetic field solutions; equivalent curved waveguide model; equivalent ideal magnetic wall waveguides; microstrip lines; microstrip ring segment; mode-matching procedure; modeling; perturbation analysis; scattering parameters; transmission properties; Electromagnetic fields; Electromagnetic modeling; Electromagnetic waveguides; Frequency; Loaded waveguides; Magnetic analysis; Microstrip; Rectangular waveguides; Reflection; Waveguide discontinuities;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.58684
Filename
58684
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