• DocumentCode
    1549966
  • Title

    Mode Symmetry Analysis and Design of CMOS Synthetic Coupled Transmission Lines

  • Author

    Tsai, Kun-Hung ; Tzuang, Ching-Kuang Clive

  • Author_Institution
    Grad. Inst. of Commun. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    59
  • Issue
    8
  • fYear
    2011
  • Firstpage
    1947
  • Lastpage
    1954
  • Abstract
    This paper presents the mode symmetry analysis and design of CMOS synthetic coupled lines that are meandered for the miniaturization design. The conventional even-odd mode analysis is not appropriate to apply due to the meandering structure, which is asymmetric. The asymmetric coupled-line model is therefore adopted for analyses and the equivalent model parameters are extracted based on ABCD-parameters converted from scattering parameters. The proposed extraction procedure is then applied on a 3-dB directional coupler as a design example. The results quantitatively show that symmetry of the coupled lines is well maintained. Symmetry of other coupled-line structures that degrade coupled-line symmetry, such as loosely coupled lines and different bend direction, are also analyzed based on this model. Finally, an equal-length bend design suitable for the CMOS synthetic coupled lines is proposed and has managed to improve symmetry on various structures.
  • Keywords
    CMOS integrated circuits; coupled transmission lines; directional couplers; ABCD-parameter; CMOS synthetic coupled transmission lines design; asymmetric coupled-line model; coupled-line symmetry; directional coupler; equal-length bend design; equivalent model parameter extraction; meandering structure; miniaturization design; mode symmetry analysis; CMOS integrated circuits; Directional couplers; Matrix decomposition; Power transmission lines; Semiconductor device modeling; Transmission line matrix methods; CMOS; coupled lines; directional coupler; synthetic waveguide;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2011.2155666
  • Filename
    5871325