DocumentCode
155243
Title
Hybrid active pixel sensor with high-sensitivity and extended dynamic range
Author
Sung-Hyun Jo ; Myunghan Bae ; Byoung-Soo Choi ; Hong-Bae Park ; Jang-Kyoo Shin
Author_Institution
Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
fYear
2014
fDate
14-17 Oct. 2014
Firstpage
153
Lastpage
156
Abstract
This paper presents a hybrid active pixel sensor (HAPS) with high-sensitivity and extended dynamic range without any complex circuit. The photodetector (PD) of the proposed HAPS is composed of a gate/body-tied (GBT) PD for high-sensitivity and a conventional n-well/p-sub PD on the same focal plane for attaining normal image. The gain of the GBT PD is a hundred-times larger compared to the conventional n-well/p-sub PD. The structure of the proposed APS is similar to the conventional 3-transistor APS. Only two transistors are added for selecting each PD (GBT PD and n-well/p-sub PD). Adding the two transfer switches allows to have two modes: the high-sensitivity mode for low-light level detection and the normal mode for higher image quality. In order to reduce pixel size of the proposed APS, the row select transistor is eliminated. Dynamic range of the proposed APS is increased to approximately 86 dB. Its pixel size is 10 μm2 for testing pixel performance. The proposed APS is being fabricated by using 1-poly 6-metal 0.18 μm standard CMOS technology.
Keywords
CMOS image sensors; image processing; photodetectors; CMOS technology; GBT PD; HAPS; extended dynamic range; gate/body-tied PD; high-sensitivity dynamic range; hybrid active pixel sensor; image quality; photodetector; Logic gates; System-on-chip; Vehicle dynamics; active pixel sensor; dynamic range; high-sensitivity; hybrid; photodetector;
fLanguage
English
Publisher
ieee
Conference_Titel
Imaging Systems and Techniques (IST), 2014 IEEE International Conference on
Conference_Location
Santorini
Type
conf
DOI
10.1109/IST.2014.6958464
Filename
6958464
Link To Document