Clarification of the Change in the Extinction Characteristics of an InP-Based Mach–Zehnder Modulator

Author

Mawatari, Hiroyasu ; Ishikawa, Mitsuteru ; Yasui, Takako ; Shibata, Yasuo ; Yamada, Eiichi ; Kikuchi, Nobuhiro ; Ishii, Hiroyuki

Author_Institution

NTT Photonics Labs., NTT Corp., Atsugi, Japan

Volume

24

Issue

16

fYear

2012

Firstpage

1450

Lastpage

1452

Abstract

The stability of the extinction characteristics of an InP-based Mach-Zehnder modulator is clarified in detail. The changes in the half-wavelength voltage (Vπ) and null point voltage (Vnull) are investigated under long-term high-temperature aging tests. The time correlations with the change in Vπ and Vnull are different from each other. By using a statistical treatment of the Weibull distribution, the degradation modes of the changes in Vπ and Vnull are clarified as a wear-out failure and an early failure, respectively.

Keywords

III-V semiconductors; Weibull distribution; indium compounds; optical modulation; InP; Mach-Zehnder modulator; Weibull distribution; extinction characteristics stability; long-term high-temperature aging tests; Aging; Degradation; Electrodes; Mach-Zehnder interferometers; Modulation; Testing; Weibull distribution; Failure analysis; Weibull distribution; optical modulation; semiconductor device reliability;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2012.2207101

Filename

6232437