• DocumentCode
    1553960
  • Title

    Interconnection analysis for standard cell layouts

  • Author

    Pedram, Massoud ; Preas, Bryan T.

  • Author_Institution
    Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    18
  • Issue
    10
  • fYear
    1999
  • fDate
    10/1/1999 12:00:00 AM
  • Firstpage
    1512
  • Lastpage
    1519
  • Abstract
    We present an accurate model and procedures for predicting the common physical design characteristics of standard cell layouts (i.e., the interconnection length and the chip area). The predicted results are obtained from analysis of the net list only, that is, no prior knowledge of the functionality of the design is used. Random and optimized placements, global routing, and detailed routing are each abstracted by procedural models that capture the important features of these processes, and closed-form expressions that define these procedural models are presented. We have verified both the global characteristics (total interconnection length and layout area) and the detailed characteristics (wire length and feedthrough distributions) of the model. On the designs in our test suite, the estimates are very close to the actual layouts
  • Keywords
    cellular arrays; circuit layout CAD; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; logic CAD; network routing; wiring; chip area; closed-form expressions; feedthrough distributions; functionality; global characteristics; global routing; interconnection analysis; layout area; net list; optimized placements; physical design characteristics; procedural models; standard cell layouts; total interconnection length; wire length; Algorithm design and analysis; Capacitance; Curve fitting; Delay estimation; Integrated circuit interconnections; Logic design; Phase estimation; Power system interconnection; Routing; Wire;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.790628
  • Filename
    790628