• DocumentCode
    1553996
  • Title

    Phrase correction by laser ablation of a polarization independent LiNbO3 Mach-Zehnder modulator

  • Author

    Chen, Chii-Chang ; Forte, H. ; Carenco, Alain ; Goedgebuer, Jean-Pierre ; Armbruster, Vincent

  • Author_Institution
    Lab. d´´Opt., Univ. de Franche-Comte, Besancon, France
  • Volume
    9
  • Issue
    10
  • fYear
    1997
  • Firstpage
    1361
  • Lastpage
    1363
  • Abstract
    We report the results obtained using a phase correction process of the TE- and TM-electrooptic responses of a Mach-Zehnder modulator integrated in a Z-propagation lithium niobate crystal. Phase correction is achieved by UV laser ablation. This ablation process allows the phase defects that can occur during the fabrication of the modulator to be cancelled out, in order to get a perfectly polarization-independent behavior.
  • Keywords
    Mach-Zehnder interferometers; electro-optical modulation; integrated optics; laser ablation; light polarisation; lithium compounds; optical fabrication; LiNbO/sub 3/; TE-electrooptic response; TM-electrooptic response; UV laser ablation; Z-propagation lithium niobate crystal; fabrication; laser ablation; perfectly polarization-independent behavior; phase correction; phase defects; polarization independent LiNbO/sub 3/ Mach-Zehnder modulator; Electrooptic modulators; Laser ablation; Optical device fabrication; Optical modulation; Optical polarization; Optical refraction; Optical variables control; Optical waveguides; Phase modulation; Refractive index;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.623263
  • Filename
    623263