DocumentCode
1555671
Title
Radiation Damage Effects by Molecular Dynamics Simulation in
Ferroelectric Crystal
Author
Xie, Guofeng ; Xiong, Ying ; Li, Baohua ; Zhu, Yong ; Li, Jiancheng ; Gu, Xiaochen ; Xiao, Yongguang ; Tang, Minghua
Author_Institution
Key Laboratory of Low Dimensional Materials and Application Technology of the Ministry of Education, Xiangtan University, Hunan, China
Volume
59
Issue
4
fYear
2012
Firstpage
1731
Lastpage
1737
Abstract
Perovskite ferroelectrics have high endurance to radiation. In order to understand the mechanism at the atomic level, molecular dynamics simulation is applied to investigate the process of defects generation and displacement cascades in
crystal. The calculated average threshold displacement energy of O, Ba and Ti atom is 53 eV, 70 eV, and 119 eV, respectively, so the number of O defects is larger than that of Ba and Ti defects. Furthermore, the simulations show that the initial movement direction of the primary knock-on atom (PKA) has significant influence on the number of defects because of different collision type (glancing collisions or direct knocks), and the number of Frenkel defects does not simply increase with increasing PKA energy due to the annealing effect. This investigation of the collision cascades is helpful to understand the radiation damage in
crystal and may offer useful guidelines to the design and applications for the practical devices.
Keywords
Atomic layer deposition; Atomic measurements; Barium; Crystals; Kinetic energy; Lattices; Radiation effects; Defects generation; displacement cascades; molecular dynamics; radiation damage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2201172
Filename
6236272
Link To Document