• DocumentCode
    1555718
  • Title

    A Block Replacement Policy for Systems Subject to Non-homogeneous Pure Birth Shocks

  • Author

    Sheu, Shey-Huei ; Chen, Yen-Luan ; Chang, Chin-Chih ; Zhang, Zhe George

  • Author_Institution
    Dept. of Stat. & Inf. Sci., Providence Univ., Taichung, Taiwan
  • Volume
    61
  • Issue
    3
  • fYear
    2012
  • Firstpage
    741
  • Lastpage
    748
  • Abstract
    This note studies the block replacement policy with general repairs for an operating system subject to shocks occurring according to a non-homogeneous pure birth process. A shock causes the system to fail. There are two types of failures: a type-I failure (minor failure) is fixed by a general repair, whereas a type-II failure (catastrophic failure) is removed by an unplanned (or unscheduled) replacement. The failure type probabilities depend on the number of type-I failure shocks that occurred since the last replacement. Under the block replacement policy, the operating system is replaced every time units to reduce the chances of more expensive unplanned replacements due to type-II failures. The aim of this note is to determine the optimal block interval T*, which minimizes the expected cost rate and the expected total discounted cost rate of the proposed policy. As the shock process is a more general non-homogeneous pure birth process, several previous models become the special cases of our model.
  • Keywords
    operating systems (computers); probability; software maintenance; system recovery; block replacement policy; catastrophic failure; failure type probability; general repairs; minor failure; nonhomogeneous pure birth shock process; operating system; optimal block interval; system failure; total discounted cost rate; type-I failure shock; type-II failure shock; unplanned replacement; unscheduled replacement; Computational modeling; Computers; Educational institutions; Electric shock; Load modeling; Maintenance engineering; Probability density function; Birth process; block replacement; shock model;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2012.2206270
  • Filename
    6236286