• DocumentCode
    1555921
  • Title

    High-efficiency cadmium-free Cu(In,Ga)Se2 thin-film solar cells with chemically deposited ZnS buffer layers

  • Author

    Nakada, Tokio ; Furumi, Keisuke ; Kunioka, Akio

  • Author_Institution
    Dept. of Electr. Eng. & Electron., Aoyama Gakuin Univ., Tokyo, Japan
  • Volume
    46
  • Issue
    10
  • fYear
    1999
  • fDate
    10/1/1999 12:00:00 AM
  • Firstpage
    2093
  • Lastpage
    2097
  • Abstract
    Cadmium-free Cu(In,Ga)Se2 (CICS) thin-film solar cells with a MgF2/ZnO:Al/CBD-ZnS/CIGS/Mo/SLG structure have been fabricated using chemical bath deposition (CBD)-ZnS buffer layers and high-quality CICS absorber layers grown using molecular beam epitaxy (MBE) system. The use of CBD-ZnS, which is a wider band gap material than CBD-CdS, improved the quantum efficiency of fabricated cells at short wavelengths, leading to an increase in the short-circuit current. The best cell at present yielded an active area efficiency of 16.9% which is the highest value reported previously for Cd-free CIGS thin-film solar cells. The as-fabricated solar cells exhibited a reversible light-soaking effect under AM 1.5, 100 mW/cm2 illumination. This paper also presents a discussion of the issues relating to the use of the CBD-ZnS buffer material for improving device performance
  • Keywords
    II-VI semiconductors; copper compounds; energy gap; gallium compounds; indium compounds; liquid phase deposition; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; solar cells; ternary semiconductors; 16.9 percent; Cu(InGa)Se2-ZnS; absorber layers; active area efficiency; band gap; chemical bath deposition; device performance; molecular beam epitaxy; quantum efficiency; reversible light-soaking effect; short-circuit current; thin-film solar cells; Buffer layers; Chemicals; Molecular beam epitaxial growth; Optical buffering; Photonic band gap; Photovoltaic cells; Sputtering; Transistors; Zinc compounds; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.792002
  • Filename
    792002