DocumentCode
1556073
Title
High-performance 980-nm quantum-well lasers using a hybrid material system of an Al-free InGaAs-InGaAsP active region and AlGaAs cladding layers grown by metal-organic chemical vapor deposition
Author
Yang, G.W. ; Hwu, R. Jennifer ; Xu, Z.T. ; Ma, X.Y.
Author_Institution
Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA
Volume
35
Issue
10
fYear
1999
fDate
10/1/1999 12:00:00 AM
Firstpage
1535
Lastpage
1541
Abstract
We report on the material growth and fabrication of high-performance 980-nm strained quantum-well lasers employing a hybrid material system consisting of an Al-free InGaAs-InGaAsP active region and AlGaAs cladding layers. The use of AlGaAs cladding instead of InGaP provides potential advantages in flexibility of laser design, simple epitaxial growth, and improvement of surface morphology and laser performance. The as-grown InGaAs-InGaAsP(1.6 eV)-AlGaAs(1.95 eV) lasers achieve a low threshold current density of 150 A/cm2 (at a cavity length of 1500 μm), internal quantum efficiency of ~95%, and low internal loss of 1.8 cm-1. Both broad-area and ridge-waveguide laser devices are fabricated. For 100-μm-wide stripe lasers with a cavity length of 800 μm, a slope efficiency of 1.05 W/A and a characteristic temperature coefficient (T0) of 230 K are achieved. The lifetime test demonstrates a reliable performance. The comparison with our fabricated InGaAs-InGaAsP(1.6 eV)-AlGaAs(1.87 eV) lasers and Al-free InGaAs-InGaAsP (1.6 eV)-InGaP lasers are also given and discussed. The selective etching between AlGaAs and InGaAsP is successfully used for the formation of a ridge-waveguide structure. For 4-μm-wide ridge-waveguide laser devices, a maximum output power of 350 mW is achieved. The fundamental mode output power can be up to 190 mW with a slope efficiency as high as 0.94 W/A
Keywords
III-V semiconductors; MOCVD; aluminium compounds; current density; etching; gallium arsenide; indium compounds; laser reliability; quantum well lasers; semiconductor growth; surface topography; vapour phase epitaxial growth; waveguide lasers; 100 mum; 1500 mum; 190 mW; 350 mW; 4 mum; 800 mum; 95 percent; 980 nm; AlGaAs cladding layers; InGaAs-InGaAsP active region; InGaAs-InGaAsP-AlGaAs; MOCVD; SCH DQW laser structure; broad-area laser devices; cavity length; characteristic temperature coefficient; epitaxial growth; fundamental mode output power; hybrid material system; internal loss; internal quantum efficiency; laser design flexibility; laser performance; lifetime test; maximum output power; reliable performance; ridge-waveguide laser devices; selective etching; slope efficiency; strained quantum-well lasers; surface morphology; threshold current density; Epitaxial growth; Laser modes; Optical design; Optical device fabrication; Optical materials; Power generation; Quantum well lasers; Surface emitting lasers; Surface morphology; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.792590
Filename
792590
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