Planck satellite 70 GHz receiver noise tests

Author

Sjöman, Pekka ; Ruokokoski, Teemu ; Jukkala, Petri ; Eskelinen, Pekka

Author_Institution

Metsahovi Radio Res. Station, Helsinki Univ. of Technol., Finland

Volume

16

Issue

12

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

19

Lastpage

23

Abstract

The LFI (Low Frequency Instruments) receivers in the coming Planck satellite are of continuous comparison type and use low noise amplifiers based on high electron mobility transistors manufactured from indium phosphide substrate (INP-HEMT-MMIC-LNAs). This article describes the 1/f-noise tests and the associated test system for the 70 GHz demonstrator receiver, which can either use single or dual channel phase switcher methods. The 1/f knee frequency is shown to depend on the calculation method of the r-value. A minimum 1/f knee frequency around 10 mHz has been achieved with full two channel foxtrot and individually adopted r-values for each phase states while a straightforward single phase technology cannot go below 40 mHz

Keywords

1/f noise; HEMT integrated circuits; MMIC amplifiers; field effect MIMIC; integrated circuit noise; millimetre wave amplifiers; millimetre wave receivers; space vehicle electronics; 1/f knee frequency; 1/f-noise tests; 70 GHz; Planck satellite; continuous comparison type; demonstrator receiver; dual channel phase switcher; flight model receiver; high electron mobility transistors; low frequency instruments receivers; low noise amplifiers; millimeter wave receivers; single channel phase switcher; Frequency; HEMTs; Instruments; Knee; Low-frequency noise; Low-noise amplifiers; MODFETs; Manufacturing; Satellites; System testing;

fLanguage

English

Journal_Title

Aerospace and Electronic Systems Magazine, IEEE

Publisher

ieee

ISSN

0885-8985

Type

jour

DOI

10.1109/62.974835

Filename

974835