• DocumentCode
    1558434
  • Title

    Shape-based optimal estimation and design of curve evolution processes with application to plasma etching

  • Author

    Berg, Jordan M. ; Zhou, Nan

  • Author_Institution
    Dept. of Mech. Eng., Texas Tech. Univ., Lubbock, TX, USA
  • Volume
    46
  • Issue
    12
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1862
  • Lastpage
    1873
  • Abstract
    Considers the problem of determining a finite number of discrete parameters appearing in a nonlinear partial differential equation describing a curve evolution process. The method is applied to the plasma etching of thin films for semiconductor manufacturing. Results are obtained within the mathematical framework of level set methods. Here, the evolution of the curve under study is captured through the evolution of a level set function. The underlying physics of the process are completely contained in a scalar function called the speed function. The degree of difficulty of treating the evolution equation depends on the functional dependencies of the speed function. The paper presents optimal estimation and design techniques based on analytical gradient computations for a class of position and orientation dependent speed functions. The technique is demonstrated on a plasma etching model taken from the literature. Only simulation results are presented, but the model under study has been shown to reproduce experimental data with reasonable accuracy. In the estimation problem, parameters in the model are fit to best match the feature shape measured in experiments. In the optimal design problem, parameter values are selected to most closely attain a desired feature shape
  • Keywords
    nonlinear differential equations; nonlinear programming; parameter estimation; partial differential equations; process control; semiconductor process modelling; semiconductor thin films; set theory; sputter etching; analytical gradient computations; curve evolution processes; evolution equation; feature shape; level set methods; nonlinear partial differential equation; parameter estimation; plasma etching; scalar function; semiconductor manufacturing; sensitivity equations; shape-based optimal design; shape-based optimal estimation; speed function; thin films; Etching; Level set; Partial differential equations; Physics; Plasma applications; Plasma materials processing; Plasma measurements; Semiconductor device manufacture; Semiconductor thin films; Shape measurement;
  • fLanguage
    English
  • Journal_Title
    Automatic Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9286
  • Type

    jour

  • DOI
    10.1109/9.975470
  • Filename
    975470