Accurate Analysis of Plasmonic Devices With a New Drude Two Critical Points MRTD Method

Author

Letizia, Rosa ; Pinto, Domenico ; Obayya, Salah S A

Author_Institution

Eng. Dept., Lancaster Univ., Lancaster, UK

Volume

24

Issue

18

fYear

2012

Firstpage

1587

Lastpage

1590

Abstract

A new Drude two critical points (D-2CP) multiresolution time domain numerical method for the simulation of surface plasmon polariton in metallic inclusions is presented. A D-2CP model is used to accurately describe the dielectric function of the metallic inclusions, and it is compared with other Drude models reported in the literature. The superior accuracy given by the D-2CP model avoids the formation of spurious reflections at the boundary interface between metal and dielectric, which can greatly affect the accuracy of the numerical results.

Keywords

critical points; plasmonics; polaritons; surface plasmons; time-domain analysis; D-2CP model; MRTD method; dielectric function; drude two critical points; metallic inclusions; multiresolution time domain numerical method; plasmonic devices; spurious reflections; surface plasmon polariton; Accuracy; Computational modeling; Numerical models; Plasmons; Silver; Time domain analysis; Drude model; Drude two critical points model (D-2CP); multiresolution time domain (MRTD); plasmonic waveguides;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2012.2209634

Filename

6244851