• DocumentCode
    1559431
  • Title

    Accuracy issues in surface resistance measurements of high temperature superconductors using dielectric resonators (corrected)

  • Author

    Mazierska, Jania ; Wilker, Charles

  • Author_Institution
    Dept. of Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia
  • Volume
    11
  • Issue
    4
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    4140
  • Lastpage
    4147
  • Abstract
    Reproducible and accurate measurements of the surface resistance of high temperature superconductors are essential for the development and commercialization of the next generation of high performance cryoelectronic systems. Dielectric resonators are the best, most accurate technique for this measurement and have been suggested for the international standard technique. This paper discusses trade-offs amongst the various types of dielectric resonators including choices of the dielectric rod, the metallic enclosure, the electrical measurements of Q-factor, resonant frequency and coupling coefficients, and other issues to ensure reproducible and accurate measurements
  • Keywords
    Q-factor; dielectric resonators; electric resistance measurement; high-temperature superconductors; measurement standards; microwave measurement; superconducting microwave devices; superconducting thin films; Q-factor; coupling coefficients; dielectric resonators; dielectric rod; electrical measurements; high performance cryoelectronic systems; high temperature superconductors; international standard technique; measurement standard; metallic enclosure; reproducible measurements; resonant frequency; superconducting films; surface resistance measurements; Commercialization; Dielectric measurements; Electric variables measurement; Electrical resistance measurement; Frequency measurement; High temperature superconductors; Measurement standards; Q factor; Resonant frequency; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.979858
  • Filename
    979858