DocumentCode
1559748
Title
A new compact DC model of floating gate memory cells without capacitive coupling coefficients
Author
Larcher, Luca ; Pavan, Paolo ; Pietri, Stefano ; Albani, Lara ; Marmiroli, Andrea
Author_Institution
Dipt. di Sci. dell´´Ingegneria, Modena Univ., Italy
Volume
49
Issue
2
fYear
2002
fDate
2/1/2002 12:00:00 AM
Firstpage
301
Lastpage
307
Abstract
This paper presents for the first time a new compact SPICE model of floating gate nonvolatile memory cells capable to reproduce effectively the complete DC electrical behavior in every bias conditions. This model features many advantages compared to previous ones: it is simple and easy to implement since it uses SPICE circuit elements, is scalable, and its computational time is not excessive. It is based on a new procedure that calculates the floating gate voltage without using fixed capacitive coupling coefficients, thus improving the floating gate voltage estimate that is fundamental for the correct modeling of cell operations. Moreover, this model requires only the usual parameters adopted for SPICE-like models of MOS transistors plus the floating gate-control gate capacitance, making it very attractive to industry as the same parameter extraction procedure used for MOS transistors can be directly applied. The model we propose has been validated on E2PROM and flash memory cells manufactured in existing technology (0.35 μm and 0.25 μm) by STMicroelectronics
Keywords
EPROM; SPICE; circuit simulation; flash memories; integrated circuit modelling; parameter estimation; 0.25 micron; 0.35 micron; DC electrical behavior; E2PROM memory cells; EEPROM; MOS transistors; SPICE circuit elements; SPICE-like models; capacitive coupling coefficients; cell operation modeling; compact DC model; compact SPICE model; computational time; flash memory cells; floating gate memory cells; floating gate nonvolatile memory cells; floating gate voltage; floating gate voltage estimate; floating gate-control gate capacitance; parameter extraction procedure; scalable model; semiconductor device modeling; Capacitance; Coupling circuits; Flash memory cells; MOSFETs; Manufacturing industries; Nonvolatile memory; PROM; Parameter extraction; SPICE; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.981221
Filename
981221
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