Full-wave analysis and modeling of multiconductor transmission lines via 2-D-FDTD and signal-processing techniques

Author

Liu, Feng ; Schutt-Ainé, José E. ; Chen, Ji

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA

Volume

50

Issue

2

fYear

2002

fDate

2/1/2002 12:00:00 AM

Firstpage

570

Lastpage

577

Abstract

The full-wave analysis of multiconductor transmission lines on an inhomogeneous medium is performed by using the two-dimensional finite-difference time-domain (FDTD) method. The FDTD data are analyzed by using signal-processing techniques. The use of high-resolution signal-processing techniques allows one to extract the dispersive characteristics and normal-mode parameters, which include decoupled modal impedances and current and voltage eigenvector matrices. A new algorithm for extracting frequency-dependent equivalent-circuit parameters is presented in this paper. Smaller CPU time and memory are required as compared to the three-dimensional FDTD case. Numerical results are presented to demonstrate the accuracy and efficiency of this method

Keywords

eigenvalues and eigenfunctions; electric impedance; equivalent circuits; finite difference time-domain analysis; matrix algebra; multiconductor transmission lines; signal resolution; transmission line theory; 2D-FDTD; CPU memory; CPU time; FDTD data; current eigenvector matrices; decoupled modal impedances; dispersive characteristics; finite-difference time-domain method; frequency-dependent equivalent-circuit parameters; full-wave analysis; high-resolution signal-processing techniques; inhomogeneous medium; modeling; multiconductor transmission lines; normal-mode parameters; signal-processing techniques; voltage eigenvector matrices; Data analysis; Data mining; Dispersion; Finite difference methods; Impedance; Multiconductor transmission lines; Performance analysis; Signal analysis; Time domain analysis; Voltage;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.982237

Filename

982237