• DocumentCode
    1560358
  • Title

    IC fabrication-compatible processing for instrumentation and measurement applications

  • Author

    Wijngaards, Davey D L ; Wolffenbuttel, Reinoud F.

  • Author_Institution
    Electron. Instrum. Lab., Delft Univ. of Technol., Netherlands
  • Volume
    50
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1475
  • Lastpage
    1484
  • Abstract
    The solid-state sensor field is maturing and an increasing number of applications is being served. Nevertheless, the available infrastructure and technology have found only few applications within the field of instrumentation and measurement (I&M). Therefore, the aim of this paper is threefold: (1) to categorize the various sensor processing strategies that are available; (2) to provide a representative overview of what different silicon sensor processing techniques are available; and (3) to point out their potential for use in metrological applications. To this end, a number of examples of (potentially) successful micromachined devices for metrology are discussed. The key considerations in this application area are: (1) the mechanical material properties of silicon and (2) the on-chip cointegration of the entire reference system
  • Keywords
    CMOS integrated circuits; batch processing (industrial); elemental semiconductors; micromachining; microsensors; silicon; CMOS wafer; IC fabrication-compatible processing; Si; batch processes; bulk micromachining; downsizing; mechanical material properties; micromachined devices; microsystem machining; modular fabrication processes; on-chip cointegration; portable standards; reference system; sensor processing strategies; solid-state sensor; surface micromachining; thin-film deposition; Application specific integrated circuits; Fabrication; Instrumentation and measurement; Material properties; Mechanical sensors; Metrology; Microelectronics; Sensor phenomena and characterization; Silicon; System-on-a-chip;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.982931
  • Filename
    982931