• DocumentCode
    1560385
  • Title

    Error analysis and reduction for a simple sensor-microcontroller interface

  • Author

    Custodio, Angel ; Pallàs-Areny, Ramon ; Bragós, Ramon

  • Author_Institution
    Dept. d´´Enginyeria Elettronica, Univ. Politecnica de Catalunya, Barcelona, Spain
  • Volume
    50
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1644
  • Lastpage
    1647
  • Abstract
    Error analysis of a resistive sensor-to-microcontroller interface based on pulse-width modulation and time-ratio measurement shows that internal input and output resistances in microcontroller digital ports produce zero, gain and nonlinearity errors. The time-ratio measurement technique cancels these errors when the sensor resistance equals the reference resistor and reduces errors around that point. We propose two simple methods of reducing those errors for sensors with a wide dynamic range. Both methods use time-ratio measurements. The first method uses several reference resistors covering the sensor resistance range; the second method uses two-point calibration. The second method is more efficient and yields errors that can be smaller than 0.5 Ω for a sensor resistance from about 600 Ω to 3550 Ω
  • Keywords
    calibration; computerised instrumentation; electric sensing devices; measurement errors; microcontrollers; pulse width modulation; time measurement; 600 to 3550 ohm; dynamic range; error analysis; error reduction; gain error; input resistance; nonlinearity error; output resistance; pulse width modulation; reference resistor; resistive sensor-microcontroller interface; time ratio measurement; two-point calibration; zero error; Digital modulation; Electrical resistance measurement; Error analysis; Gain measurement; Measurement techniques; Microcontrollers; Pulse measurements; Pulse modulation; Resistors; Space vector pulse width modulation;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.982960
  • Filename
    982960